By Graham C. Smith
This booklet is t~e 5th in aseries of medical textbooks designed to hide advances in chosen examine fields from a easy and common view aspect. The reader is taken conscientiously yet swiftly in the course of the introductory fabric so that t~e value of modern advancements will be understood with in basic terms restricted preliminary wisdom. The inclusion within the Appendix of the abstracts of a number of the extra vital papers within the box offers additional information for the non-specialist, and acts as aspringboard to supplementary studying in case you desire to seek advice the unique liter ature. floor research has been the topic of various books and evaluation articles, and the elemental clinical rules of t~e extra well known concepts at the moment are kind of weIl proven. This booklet is anxious with the very strong suggestions of Auger electron and X-ray photoelectron spectroscopy (AES and XPS), with an emphasis on how they're played as a part of a latest analytical facility. because the improvement of AES and XPS within the overdue Nineteen Sixties and early Nineteen Seventies there were nice strides ahead within the sensitivities and resolutions of the instrumentation. at the same time, those spectroscopies have gone through a veritable explosion, either of their reputation along extra regimen ana1ytical ideas and within the variety of difficulties and fabrics to which they're utilized. therefore, many researchers in and in academia now come into touch with AES and XPS now not as experts, yet as users.
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Additional info for Surface Analysis by Electron Spectroscopy: Measurement and Interpretation
6] and the potentials of the inner and outer hemispheres are Vp[3-2ro/rl] and Vp [3-2r o /r2] respectively. 7] where «is the maximum angle electrons make with the axis. Electrons are preretarded to the pass energy Ep be fore analysis, therefore for a given pass energy the energy resolution ~E is constant. Outer hemisphere Inner hemisphere Ineident radiation ------. 4 Schematic arrangement of a simple hemispherical sec tor electron energy analyser. Also shown is one possible arrangement of the electronic system necessary to power such a device.
A method of generating XPS images in conventional apparatus without using the transmission geometry has been developed by Gurker et al (1983). Here, the sample is flooded with X-rays and a line source is selected using a narrow input slit to the analyser. E1ectrons of the chosen peak energy are focussed by the spherica1 sector ana1yser to the output slit, where they are detected using a position sensitive detector. The two-dimensiona1 position sensitive detector records spectral information along the dispersive direction normal to the major axis of the input slit, and spatial information a10ng the 1ine of the input slit.
Control of the X-ray spot size may be obtained through a variable focus of the electron source impinging upon the anode. With good design, X-ray beam sizes contollable over a range of around 100 pm to 1 mm may be achieved (Chaney, 1987). The useful throughput of such a system may be optimised by the use of an electron spectrometer whose acceptance area on the sampie is equal to, and aligned with, the small illuminated spot. This involves the use of an electron lens of low aberration between the sampie and the analyzer, with magnification such that the image of the illuminated spot at the input slit is matched to the size of that slit.