By Gerald R. Lachance (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Gregory J. McCarthy, Paul K. Predecki, Richard Ryon, Deane K. Smith (eds.)
Whole trend becoming, Rietveld research, and Calculated Diffraction styles. Quantitative section research by means of XRay Diffraction (XRD). skinny movie and floor Characterization by means of XRD. Lattice Defects and XRay Topography. Texture research by way of XRD. XRD Instrumentation, recommendations, and Reference fabrics. pressure decision by means of Diffraction equipment. XRD Profile becoming, Crystallite measurement and pressure choice. XRD purposes: Detection Limits, Superconductors, Organics, Minerals. Mathematical tools in XRay Spectrometry (XRS). skinny movie and floor Characterization by means of XRS and XPS. overall mirrored image XRS. XRS options and Instrumentation. XRS purposes. XRay Imaging and Tomography. 161 articles. Index.
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Extra resources for Advances in X-Ray Analysis: Volume 35B
V. I. SMOLNIAKOV AND I. A. KOLTUN Table 1. Comparison of test data processed by different software - new one, "EDXRF" and "AXIL" (all data are given in normalized parts of pure element profUes) Models type test data Fe / Co Rb / Y Sa / . 0 1. 0000 / 1. 0041 1. 0211525 1. 0000 / 1. 0241 1. 0/0. 00098713 1. 0/1. 0 1. 0000 / 1. 01025 / ---- As a criteria for reliability and correctness of solution it is possible not only to get covariance matrix (5) and estimation for X2, but to see the curve of weighted residuals in order to control trends, including statistical criteria.
U.. : SIm_dolo 5 10 15 20 Energy (kev) Fig. 2 2024 Aluminium Alloy X roy spectra 25 JO 732 X. : ~""~J_'" ... ~~.... 5 10 15 20 25 JO Energy (kev) Fig. 4 Stainless Steel X Ray Spectro To verify the NCSXRF code, the X-ray spectrum of one of the standard samples mentioned above is measured first, then the simulated X-ray spectrum is obtained by running the Monte Carlo simulation code based on the known sample elemental composition. The measured X-ray pulse height spectrum (dots) and simulated X-ray pulse height spectrum (line) of the standard samples are shown in Figs.
In the present work, an improved EDXRF Monte Carlo simulation code has been developed. The improvements are as follows: 1. A general geometry subroutine named HERMETOR (Prettyman, Gardner and Verghese, 1990) has been added so that very complex geometries like those of secondary fluorescer analyzers can be simulated. T. HE ET AL. 729 2. 1989) have been added to make the code more efficient. 3. The MCLLS principle has been included and implemented. This requires the categorizing of the scored X-ray weights in such a way that the required library spectrum for each individual element and the elemental X rays scattering from materials surrounding the sample as another library spectrum are obtained.